xtest regression 4007_ecc and 4011 leave generated keys behind about optee_test HOT 6 CLOSED

Agreed.

from optee_test.

Is there an easy way to fix it? I'm not very familiar with xtest code but I think the missing bit is ta_crypt_cmd_free_transient_object

from optee_test.

@jforissier I tried to fix the issue, but my knowledge of op-tee is very limited. The key pairs are generated on the se050 when tests call TEE_GenerateKey. This is the case in both tests (4007_ecc and 4011). I think all tests that call ta_crypt_cmd_generate_key will suffer from this issue. I re-ran my tests with level 1. This enables RSA key pair generation in test 4007 and it left 4 more key pairs in the se050. Could you tell me if there is an op-tee method for removing the key pairs from se050 that I can use? I searched the API and nothing stands out.

from optee_test.

I don't have an answer but I believe @ldts can help.

from optee_test.

yes, it is borken with the regression xtests (not with the pkcs11 ones) : see OP-TEE/optee_os#5086

I suggest using some tool like https://github.com/foundriesio/fio-se05x-cli to clear the device nvm until we have a proposal to the issue above..

from optee_test.

This issue has been marked as a stale issue because it has been open (more than) 30 days with no activity. Remove the stale label or add a comment, otherwise this issue will automatically be closed in 5 days. Note that you can always re-open a closed issue at any time.

from optee_test.