The complete analytical GUI tools for fast data processing, analysis and visualization used in the group of MDI (Materials Discovery and Interfaces). Afterwards, all kinds of data including raw data, intermediate data and processed data could be saved/exported for further analysis.

1. EDX measurement related tools

• EDX composition: view and analysis EDX data. The data could be a complete materials library containing 342 measurement points or a strip or a chip.
• Adjust materials libraries composition: predict and find the desired element content ratio for sputtering experiment. The tool supports any number of cathodes.
• Wafer (materials libraries) comparison: compare how similar are two libraries in the given deviations.

2. Thickness tools

• Thickness: determine and calculate thickness data obtained from profilometer (Ambios)

3. XRD related tools

• 2D to 1D convert: automated convert XRD frames (Bruker D8 Discover) into any kind of supported format.
• Baseline subtraction: subtract baseline for XRD data.
• Phase identification: XRD data analysis and phase determination based on comparison of data with ICSD database.
• Reference (.cif) rename: rename and reformat XRD data.

4. Band gap and resistence related tools

• Band gap determination: automated calculate band gap.
• Room-temperature resistance: visualize resistance data.
• Temperature-dependent resistance: analysis and view of multiple reisitance data.

5. Electrocatalytic related tools

• SDC analysis: fast view heatmap for a library data
• SECCM tool: define the overlapping of XRD and electrocatalytic data.

6. Other tools

• Sputter concentration: get a first impression of sputtering results
• Wafer photo RGB: view and extract wafer image from photos

This package has been tested exclusively on Windows 10 operating systems.

The list of required python packages is contained in the requirements.txt <requirements.txt>_ file in this repository.

Install the requirements from PyPI using pip. ::

$ python3 -m pip install -r requirements.txt